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PVE300 Photovoltaic EQE (IPCE) and IQE

The PVE300 Photovoltaic EQE (Incident Photon to Converted Electron) and IQE (Internal Quantum Efficiency) solution is an advanced analytical system designed for precise and comprehensive characterization of photovoltaic devices. This system enables accurate measurement of the EQE and IQE, essential parameters for understanding the efficiency and performance of solar cells. The PVE300 offers versatile testing capabilities, accommodating a wide range of photovoltaic technologies from traditional silicon-based cells to emerging thin-film and organic photovoltaic materials. It is equipped with a highly sensitive and accurate measurement setup, ensuring reliable data for both research and development and quality control purposes. The system's integrated software and user-friendly interface facilitate straightforward operation and data analysis, making it a valuable tool for optimizing solar cell designs and improving energy conversion efficiency.


Outdoor PV Testing Facilities

We operate several outdoor experimental photovoltaic (PV) systems, including:

  1. 3 kW vertical bifacial PV system.

  2. 8 kW monocrystalline silicon PV system.

  3. 50 kW bifacial system utilizing both monocrystalline and polycrystalline silicon PV panels.

  4. 100 kW system with monofacial multicrystalline silicon PV panels.

  5. 1.5 kW of perovskite PV panels, designed for small-scale outdoor testing.

  6. 12 kW thin-film PV system.

All of these systems are accompanied by weather stations and data monitoring platforms, utilising SolarEdge optimisers for enhanced performance analysis. Additionally, pyranometers are installed with each system to accurately measure solar irradiance, allowing for precise evaluation of the PV systems' efficiency under varying environmental conditions.


EL, PL, UVF, Thermal IR, PV Testing Kits

We possess state-of-the-art testing equipment suitable for all types of solar panels, including electroluminescence (EL) imaging, photoluminescence (PL) imaging, UV Fluorescence (UVF), thermal infrared (IR), and the PV200 testing kit for solar PV systems. This advanced suite of tools enables comprehensive assessment of solar panel performance and quality, ensuring detailed analysis through various imaging techniques and performance metrics.


Sol3ATM Class AAA Solar Simulator IEC/JIS/ASTM, 1600 Watt Xenon, 8x8

The Sol3ATM Class AAA Solar Simulator is a state-of-the-art solar simulation device designed to provide highly accurate and reliable sunlight simulation for testing and research purposes. Adhering to the rigorous standards set by IEC, JIS, and ASTM, this solar simulator is equipped with a powerful 1600 Watt Xenon lamp capable of delivering consistent and controllable illumination. The 8x8 configuration refers to its ability to produce a uniform light field of 8 inches by 8 inches, making it ideal for a wide range of applications including photovoltaic testing, material aging, and chemical analysis. Its Class AAA rating signifies top-tier performance in three critical aspects: spectral match, uniformity of irradiance, and temporal stability, ensuring that the simulator closely replicates natural sunlight conditions.


ALD (Atomic Layer Deposition) System

An Atomic Layer Deposition (ALD) system is a sophisticated piece of equipment used for thin film deposition, a process crucial in the fabrication of semiconductor devices, solar cells, and various nanostructured materials. ALD operates on the principle of sequential surface reactions, enabling the deposition of atomically thin layers of material with precise thickness control and uniformity over complex surfaces. This technique allows for the growth of films at a molecular level, making it possible to engineer surfaces with specific properties, such as high electrical conductivity, optical transparency, or chemical resistance. The ALD system is highly valued in industries requiring extreme precision and control over material properties, including electronics, photovoltaics, and nanotechnology. Its ability to deposit a wide range of materials, including metals, oxides, and sulfides, with unparalleled control makes it a critical tool in advancing the capabilities of modern materials science and engineering.


FEI Nova 200 scanning electron microscope (FIBSEM)

The FEI Nova 200 FIBSEM is a sophisticated dual-beam microscope that integrates Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) technologies, designed for precise material processing and high-resolution imaging. This system enables users to perform site-specific milling, deposition, and analysis with nanometer precision. The FIB technology allows for the manipulation and modification of materials at the micro and nano scale, including cutting, deposition, and etching, while the SEM component provides detailed and high-resolution imaging of the sample surface. The FEI Nova 200 is particularly valuable in the fields of materials science, semiconductors, and life sciences for applications such as circuit editing, microstructural analysis, and 3D reconstruction of biological specimens. Its advanced capabilities make it a powerful tool for researchers and engineers requiring detailed analysis and manipulation of materials at the nano scale.

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